Nano and Pico Characterization Laboratory

An unprecedented collection of instrumentation for surface analysis at the nanoscale and beyond.

Dimension® FastScan® Atomic Force Microscope with ScanAsyst™

The Bruker Dimension FastScan with ScanAsyst™ delivers, for the first time, extreme imaging speed without sacrificing legendary resolution and performance. This breakthrough innovation enables radically faster time to publishable data for all levels of AFM expertise. Innovative optical design allows use of all Bruker broadband small cantilevers, as well as traditional sized cantilevers.

The FastScan AFM system is the latest evolution of Bruker’s industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors in its scanners to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in X-Y. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new AFM experience.