Nano and Pico Characterization (NPC) Laboratory
The NPC Technology Center offers a curated collection of high-end scientific instrumentation to enable the physicochemical characterization of nanoscale materials, devices, and systems under a wide range of experimental conditions. Our technical capabilities and expertise include surface analysis by Scanning Probe Microscopy (SPM); hydrodynamic size and surface charge analysis by Dynamic Light Scattering (DLS) and Zeta Potential (ZP) measurements; elemental and chemical analysis by Inductively Coupled Plasma Mass Spectrometry (ICP-MS).
- Semiconductors and devices
- Energy harvesting/storage
- (Nano)drug delivery
- Surface analysis
- Topography & roughness
- Electrical & magnetic
- Shape, size, dispersity
- Dissolution kinetics
- Compositional and isotopic analysis
- Scanning Probe Microoscopy
- Optical Profilometry
- Dynamic Light Scattering
- Electrokinetic Analysis
- Zeta Potential
- ICP – Optical Emmision Spectrometry
- ICP – Mass Spectrometry
December 19, 2019 | Introducing new capabilities for biomechanics of cells and tissues in the NPC Technology Center
Now combined with both a confocal (Zeiss LSM5) and stereomicroscope (Leica M205 FCA), this state-of-the-art, multimodal system combines the power of two established techniques to interrogate the role of biomechanics in natural systems and as a platform for the...
August 20, 2019 | New Nanoparticle Analyzer Available Through November 2019
The nCS1 is a leading-edge technology that measures the concentration and size of particles ranging from 50 nanometers to 10 microns diameter in a liquid. The technology uses Microfluidic Resistive Pulse Sensing (MRPS), which is an electrical (non-optical) method for...
Award to Bertozzi will help UCLA create new math nanosystems initiative
June 7, 2017 | Award to Bertozzi will help UCLA create new math nanosystems initiative UCLA Newsroom | June 07, 2017This article was originally published by the UCLA Newsroom UCLA will create the new Simons Mathematical NanoSystems Initiative, in part with support...