MultiMode® 8-HR Scanning Probe Microscope
The MultiMode® 8 represents the next generation of the world’s highest-resolution, most application-proven scanning probe microscope. This high-performance state-of-the-art SPM features a compact hardware design, high-speed fifth-generation controller, environmental control capabilities, and user-friendly software in order to enable remarkably easy acquisition of data from micro- to atomic-scale images. Proven productivity, flexibility, and reliability have made MultiMode series SPMs the performance leader in materials, life sciences, and polymers research.
The MultiMode 8 with ScanAsyst-HR features multiple scanners that permit each user to tailor the system for individual research. Scanners with large scan ranges up to 125 microns on the XY axes and a Z range up to 5 microns, as well as high-resolution scanners with 0.4 microns on the XY axes and submicron Z range, let users position the tip at any point on the surface without adjusting for lateral movement of the tip during approach. These scanners minimize X,Y, and Z cross-coupling and the effects of nonlinearity and hysteresis, while maintaining calibration throughout the full vertical range.
Now available on the MultiMode 8, the new ScanAsyst™ atomic force microscopy imaging mode is the world’s first image-optimization scan mode for AFM microscopes. This patent-pending innovation utilizes intelligent algorithms to automatically and continuously monitor image quality, and to make the appropriate parameter adjustments. This frees researchers from the complex and tedious task of adjusting setpoints, feedback gains, and scan rates, making imaging as easy as simply selecting a scan area and scan size for almost any sample in either air or fluid.
High-speed ScanAsyst-HR maintains and pushes the MultiMode platform’s legacy to new heights by providing the resolution and performance you expect — at scan rates 6X faster than conventional scan rates and survey scanning rates up to 20X faster with no loss of resolution.
The MultiMode 8 SPM system includes Veeco’s fifth-generation NanoScope V controller, which utilizes advanced high-speed electronics along with A/D and D/A converters operating at 50MHz, to deliver reliable, high-speed data capture.
The MultiMode 8 performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, friction, adhesion, and electrical and magnetic fields:
- TappingMode AFM
- Contact Mode AFM
- PeakForce Tapping™
- Lateral Force Microscopy (LFM)
- Magnetic Force Microscopy (MFM)
- Force Modulation
- Electric Force Microscopy (EFM)
- Surface Potential Microscopy
- Force-Distance and Force-Volume Measurements
- Electrochemical Microscopy (ECAFM)
- PicoForce Force Spectroscopy
- Tunneling AFM (TUNA)
- Conductive AFM (CAFM)
- Torsional Resonance Mode (TRmode)
Syndiotactic polypropylene (sPP) film imaged with ScanAsyst. Scan size 32 ?m.
Multilayered polymer film imaged with PeakForce QNM. Quantitative modulus data map has been overlaid on a 3D image of the surface topography. Scan size 10 ?m.