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Nano and Pico Characterization Laboratory

An unprecedented collection of instrumentation for surface analysis at the nanoscale and beyond.

Nano and Pico Characterization Laboratory

Equipment

 

JPK Nanowizard 4A

Today’s research topics in nanoscience are complex. Therefore a highly flexible AFM system is the first choice. With the new NanoWizard® 4a AFM you are well prepared for any future research project. The system comes with a wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties and seamless integration with advanced optical techniques. As a result of JPK‘s leading tip-scanner technology and our consistent modular design philosophy, the NanoWizard® 4a is the most flexible system available on the market today.

The NanoWizard® 4a NanoScience AFM combines closed-loop atomic resolution with fast scanning capabilities of up to 3 sec/image in a system and comes with a large scan range of 100µm in XY. It has the lowest noise levels of a closed-loop scanner and deflection detection system. The powerful digital Vortis™ A controller combines fast signal handling with lowest noise.

As an expert in force measurements JPK provides a complete set of methods to characterize mechanical properties. Especially for very soft or delicate samples or for samples under external load we have the right solution. JPK’s QI™ mode with its linear Z-movement and a full set of quantitative data in every pixel allow the extraction of quantitative data such as elasticity, adhesion, dissipation, chemical forces or conductivity. The automated large z-adjustment is developed for swelling samples or with a rough topography. The enhanced data analysis capabilities – especially for modulus calculation with its variety of selectable models – is a great benefit.

  • Enhance productivity, probe more sample areas in same time.
  • Do a quick survey over your sample.
  • Observe changes following sample dynamics in real time.
  • Perform time lapse studies on polymers, thin films, advanced materials, capsules and others.